A dudou-shaped test block, comprising a testing structure (1), a first beam-path structure (2), and a second beam-path structure (3). A first arc-shaped indentation and a second arc-shaped indentation are provided on one side of the testing structure (1). The other side of the testing structure (1) is a flat surface, and the first beam-path structure (2) and the second beam-path structure (3) are both flat plates. The thickness of the first beam-path structure (2) is less than the thickness of the second beam path structure (3). The first beam path structure (2) and the second beam path structure (3) are both in contact with the flat surface and arranged parallel thereto. The first arc-shaped indentation is arranged corresponding to the first beam path structure (2), and the second arc-shaped indentation is arranged corresponding to the second beam path structure (2).
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