CURRENT SAMPLING METHOD AND CURRENT SAMPLING CIRCUIT

摘要

A current sampling method (100) and a current sampling circuit. The method (100) comprises: acquiring a detection temperature of each semiconductor switch device (M1-Mn) amongst a plurality of semiconductor switch devices (M1-Mn) connected in parallel (S110); on the basis of the detection temperature of each semiconductor switch device (M1-Mn), determining that the plurality of semiconductor switch devices (M1-Mn) connected in parallel are in a current equalisation state (S120); in the current equalisation state, acquiring an equalising current flowing through a target semiconductor switch device (M1), the target semiconductor switch device (M1) being any one semiconductor switch device (M1-Mn) amongst the plurality of semiconductor switch devices (M1-Mn) connected in parallel (S130); and, on the basis of the equalising current, determining the total current of the main circuit connected to the plurality of semiconductor switch devices (M1-Mn) connected in parallel (S140). Current sampling accuracy is thereby improved.