首页> 外国专利> METHOD FOR IN SITU PROTECTION OF AN ALUMINUM LAYER AND OPTICAL ARRANGEMENT FOR THE VUV WAVELENGTH RANGE

METHOD FOR IN SITU PROTECTION OF AN ALUMINUM LAYER AND OPTICAL ARRANGEMENT FOR THE VUV WAVELENGTH RANGE

机译:VUV波长范围的铝层的原位保护和光学布置的方法

摘要

The invention relates to a method for in situ protection of a surface (7a) of an aluminum layer (7) of a coating (6) – which reflects VUV radiation (11, 21) – of an optical element (4), which is arranged in an interior of an optical arrangement for the VUV wavelength range, against the growth of an aluminum oxide layer (8), comprising: carrying out an atomic layer etching process for layer-by-layer removal of the aluminum oxide layer (8), wherein the atomic layer etching process comprises a surface modification step and a material detachment step, wherein, in the surface modification step, at least one boron halide as surface-modifying reactant is fed to the interior in a pulsed manner, and wherein a plasma (31) is generated in the interior at a surface (8a) of the aluminum oxide layer (8) at least during the material detachment step. The atomic layer etching process is carried out until the aluminum oxide layer (8) attains a thickness (D) of less than 5 nm or the aluminum oxide layer (8) is kept at a thickness (D) of less than 5 nm by the atomic layer etching process. The invention also relates to an optical arrangement for the VUV wavelength range, for example an inspection system or a VUV lithography apparatus.
机译:本发明涉及一种原位保护涂层(6)的铝层(7)的表面(7a)的方法,该涂层反射光学元件(4)的VUV辐射(11、21)。布置在VUV波长范围的光学装置的内部,以防止氧化铝层(8)的生长,包括:进行原子层蚀刻工艺以逐层去除氧化铝层(8) ,其中原子层蚀刻工艺包括表面改性步骤和材料分离步骤,其中,在表面改性步骤中,将至少一种卤化硼作为表面改性反应物以脉冲方式进料至内部,并且其中等离子体(31)至少在材料分离步骤期间在氧化铝层(8)的表面(8a)的内部产生。进行原子层蚀刻工艺,直到氧化铝层(8)的厚度(D)小于5纳米或氧化铝层(8)的厚度保持在小于5 nm的厚度(D)为止。原子层蚀刻工艺。本发明还涉及用于VUV波长范围的光学装置,例如检查系统或VUV光刻设备。

著录项

  • 公开/公告号WO2020115109A1

    专利类型

  • 公开/公告日2020-06-11

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号WO2019EP83621

  • 发明设计人 SHKLOVER VITALIY;

    申请日2019-12-04

  • 分类号G02B5/08;G02B27;G03F7/20;

  • 国家 WO

  • 入库时间 2022-08-21 11:10:48

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号