METHOD FOR DETECTING THE SURFACE CONDITION OF COMPONENTS, USE OF THE METHOD FOR MONITORING THE SURFACE QUALITY OF COMPONENTS AND APPARATUS FOR ADJUSTING THE SURFACE CONDITION OF COMPONENTS

摘要

The present invention relates to methods for detecting differences in the surface condition of one or more components, in which the infrared radiation emitted by the component at a specific temperature of the component is detected as irradiance on a predetermined receiver surface relative to the component. When detecting at different positions or on a plurality of components it is ensured that the solid angle covered by the receiver surface and the distance from the component surface is almost unchanged. Differences in the detected irradiance can then be equated with differences in the surface condition of the components. The invention further relates to the use of such methods according to the invention for monitoring and optionally adjusting the surface quality of a component originating from a manufacturing process and also an apparatus for adjusting the surface condition in the mass production of components.