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CALIBRATION DEVICE, CALIBRATION METHOD, PROGRAM, CALIBRATION SYSTEM, AND CALIBRATION TARGET

机译:校准装置,校准方法,程序,校准系统和校准目标

摘要

A calibration unit 60 acquires detection signals indicating calibration target detection results generated for each of a plurality of sensors of a sensor unit 40. A state detection unit 61 uses the detection signals to detect the state of a calibration target. A time difference correction amount setting unit 65 uses a calibration target state detection result obtained by the state detection unit 61 to calculate the time difference between the detection signals generated for each of the sensors of the sensor unit 40, and uses the result of the calculation to set a time difference correction amount. This makes it possible to correct the time lag between the information acquired by the plurality of sensors of the sensor unit 40 on the basis of the time difference correction amount set by the time difference correction amount setting unit 65.
机译:校准单元60获取指示针对传感器单元40的多个传感器中的每个传感器生成的校准目标检测结果的检测信号。状态检测单元61使用该检测信号来检测校准目标的状态。时差校正量设定单元65使用由状态检测单元61获得的校准目标状态检测结果来计算针对传感器单元40的每个传感器生成的检测信号之间的时间差,并使用计算结果设置时差校正量。这使得可以基于由时差校正量设置单元65设置的时差校正量来校正由传感器单元40的多个传感器获取的信息之间的时间差。

著录项

  • 公开/公告号WO2020129369A1

    专利类型

  • 公开/公告日2020-06-25

    原文格式PDF

  • 申请/专利权人 SONY SEMICONDUCTOR SOLUTIONS CORPORATION;

    申请/专利号WO2019JP39994

  • 发明设计人 YAMAMOTO HIDEAKI;

    申请日2019-10-10

  • 分类号G01S7/40;G01S13/86;G01S13/87;G01S13/93;

  • 国家 WO

  • 入库时间 2022-08-21 11:10:32

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