首页> 外国专利> IMAGING SYSTEM OF STIMULATED EMISSION LOSS MICROSCOPE

IMAGING SYSTEM OF STIMULATED EMISSION LOSS MICROSCOPE

机译:受激发射损耗显微镜的成像系统

摘要

An imaging system of a stimulated emission loss microscope, the system comprising a loss light unit (1), an excitation light unit (2), an imaging unit (3) and a counter unit (4). The loss light unit (1) generates ring loss light and controls the light intensity and polarization of the ring loss light; the excitation light unit (2) is triggered by the loss light unit (1) to emit Gaussian excitation light; the Gaussian excitation light is divided into first Gaussian excitation light and second Gaussian excitation light by means of a third Glan prism (243); the ring loss light overlaps the first Gaussian excitation light and then the overlapped light is inputted into the imaging unit (3); and the imaging unit (3) scans and images a sample and collects a fluorescent signal. The second Gaussian type excitation light is used as a reference signal and enters, together with the fluorescence signal, the counter unit (4), thereby being used for fluorescence intensity imaging and fluorescence lifetime imaging. When low ring loss light energy is applied, the fluorescence lifetime of the sample increases along with the laser irradiation time; and the saturation intensity of the fluorescent sample is reduced due to the increased fluorescence lifetime, so that the imaging resolution may be improved further.
机译:受激发射损耗显微镜的成像系统,该系统包括损耗光单元(1),激发光单元(2),成像单元(3)和计数单元(4)。损耗光单元(1)产生环形损耗光并控制环形损耗光的光强度和偏振;激发光单元(2)由损耗光单元(1)触发,以发射高斯激发光。利用第三格兰棱镜(243)将高斯激发光分为第一高斯激发光和第二高斯激发光。环损光与第一高斯激发光重叠,然后将重叠的光输入成像单元(3)。成像单元(3)对样品进行扫描成像并收集荧光信号。第二高斯型激发光用作参考信号,并与荧光信号一起进入计数单元(4),从而用于荧光强度成像和荧光寿命成像。当施加低环损光能时,样品的荧光寿命随着激光照射时间的延长而增加;由于延长了荧光寿命,降低了荧光样品的饱和强度,因此可以进一步提高成像分辨率。

著录项

  • 公开/公告号WO2020140283A1

    专利类型

  • 公开/公告日2020-07-09

    原文格式PDF

  • 申请/专利权人 SHENZHEN UNIVERSITY;

    申请/专利号WO2019CN70468

  • 发明设计人 YAN WEI;QU JUNLE;WANG LUWEI;YE TONG;

    申请日2019-01-04

  • 分类号G02B21;G01N21/64;

  • 国家 WO

  • 入库时间 2022-08-21 11:10:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号