AI INTELLIGENT PROCESS ABNORMALITY RECOGNITION CLOSED-LOOP CONTROL METHOD, HOST AND DEVICE SYSTEM

摘要

Provided are an AI intelligent process abnormality recognition closed-loop control method, a host and a device system. The AI intelligent process abnormality recognition closed-loop control method comprises: receiving state-related data of a solar cell sheet in real time (S10); comparing the state-related data with normal state data, determining a state of the solar cell sheet (S20); when the solar cell sheet is in an abnormal state, obtaining a first abnormality level by means of matching the state-related data with an abnormality level database (S30); and performing a corresponding abnormality processing policy according to the first abnormality level (S40). According to the solution, a state of a cell sheet on a solar cell assembly production line is monitored intelligently and in real time; and according to different states of the cell sheet, the operation of the solar cell assembly production line is automatically guided and controlled, thereby reducing manual participation, improving the production efficiency of the solar cell assembly production line, and also improving the yield of the products.