TESTING APPARATUS AND EVALUATION METHOD FOR EVALUATING EMISSION PERFORMANCE OF SEMI-CONDUCTIVE BLOCKING MATERIAL

摘要

The present invention relates to a testing apparatus for evaluating the emission performance of a semi-conductive blocking material, comprising a vacuum control system and a performance testing system. The performance testing system comprises a testing chamber, a testing sample, an object placement platform, an anode, an ammeter, a protective resistor, and a high-voltage direct current power supply. The testing sample is fixed on the object placement platform and functions as a cathode. The anode is connected to a positive electrode terminal of the high-voltage direct current power supply. The testing sample is connected to a cathode terminal of the high-voltage direct current power supply. The cathode terminal of the high-voltage direct current power supply is grounded. The protective resistor and the ammeter are serially connected in a circuit. The anode and the cathode are both disposed inside of the testing chamber. The vacuum control system controls the testing chamber to be in a vacuum state. The present apparatus can directly test the charge carrier emission state of a semi-conductive blocking material in a high electric field, which represents the performance of the semi-conductive blocking material with respect to the insulating layer electric charge implantation when used as a high-voltage direct current electrical cable. The present invention has significance in the research of high-voltage direct current transmission cables.