Display device quality checking methods, devices, electronic devices and storage media

摘要

The present application provides a display device quality inspection method, apparatus, electronic device and storage medium, wherein the method is collected by an image collection facility on the production line of the display device sent from a control unit arranged on the production line of the display device. Receiving a quality inspection request including a display device image; Performing image preprocessing on the display apparatus image, and inputting the display apparatus image after preprocessing to a defect inspection model to obtain a defect inspection result, wherein the defect inspection model uses a deep convolutional neural network structure and an instance segmentation algorithm. To learn about past defect display device images; Determining whether the quality of the display device corresponding to the display device image is good or bad according to the defect inspection result. The defect inspection according to the above technical measures has high accuracy, good system performance, and high work expansion capability.