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INSPECTION METHOD FOR APPEARANCE BADNESS AND INSPECTION SYSTEM FOR APPEARANCE BADNESS

机译:外观健康检查方法及外观健康检查系统

摘要

An appearance defect inspection method of the present invention comprises the steps of: acquiring an inspection image; recovering the inspection image by means of a trained denoising auto-encoder (dA), and extracting a difference between the recovered image and the inspection image to a recovery error map; converting the recovery error map to a binary error map; sizing a defect area in the binary error map by means of morphology image processing and blob processing, and detecting a defect candidate whose size of defect area is greater than a predetermined size; extracting a region of interest (ROI) patch of the defect candidate, and scaling the ROI patch to a predetermined size; and calculating a defect probability of the scaled ROI patch of the defect candidate by means of a learned convolution neural network (CNN), and determining the defect candidate to be a defective product if the defect probability is greater than a predetermined value, or determining the defect candidate to be an acceptable product if the defect probability is equal to or less than the predetermined value.
机译:本发明的外观缺陷检查方法包括以下步骤:获取检查图像;以及通过训练的降噪自动编码器(dA)恢复检查图像,并将恢复的图像和检查图像之间的差异提取到恢复误差图;将恢复错误图转换为二进制错误图;通过形态图像处理和斑点处理来确定二进制误差图中的缺陷区域的大小,并检测缺陷区域的大小大于预定大小的候选缺陷;提取缺陷候选者的感兴趣区域(ROI)补丁,并将所述ROI补丁缩放到预定大小;借助于学习的卷积神经网络(CNN)计算出所述缺陷候选的缩放后的ROI补丁的缺陷概率,如果所述缺陷概率大于预定值,则将所述缺陷候选确定为缺陷产品;如果缺陷概率等于或小于预定值,则将候选缺陷作为可接受的产品。

著录项

  • 公开/公告号KR20200039049A

    专利类型

  • 公开/公告日2020-04-16

    原文格式PDF

  • 申请/专利权人 GL-TECH;

    申请/专利号KR20180117506

  • 发明设计人 KO YOUNG JUN;

    申请日2018-10-02

  • 分类号G06T7;G01N21/88;

  • 国家 KR

  • 入库时间 2022-08-21 11:07:25

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