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60 MULTIPLE SPACER ASSISTED PHYSICAL ETCHING OF SUB 60NM MRAM

机译:低于60NM MRAM的60个多间隔辅助物理刻蚀

摘要

An MTJ stack is deposited on a bottom electrode. A top electrode layer and hard mask are deposited on the MTJ stack. The top electrode layer not covered by the hard mask is etched. Thereafter, a first spacer layer is deposited over the patterned top electrode layer and the hard mask. The first spacer layer is etched away on horizontal surfaces leaving first spacers on the sidewalls of the patterned top electrode layer. The free layer not covered by the hard mask and first spacers is etched. Thereafter, the steps of depositing a subsequent spacer layer over patterned previous layers, etching away the subsequent spacer layer on horizontal surfaces leaving subsequent spacers on the sidewalls of the patterned previous layers, and thereafter etching a next layer not covered by the hard mask and subsequent spacers are repeated until all layers of the MTJ stack have been etched to complete the MTJ structure.
机译:MTJ叠层沉积在底部电极上。顶部电极层和硬掩模沉积在MTJ叠层上。蚀刻未被硬掩模覆盖的顶部电极层。此后,在图案化的顶部电极层和硬掩模上方沉积第一隔离层。第一间隔物层在水平表面上被蚀刻掉,从而在图案化的顶部电极层的侧壁上留下第一间隔物。蚀刻未被硬掩模和第一间隔物覆盖的自由层。此后,进行以下步骤的步骤:在图案化的先前层上沉积后续的间隔层,在水平表面上蚀刻掉后续的间隔层,在图案化的先前层的侧壁上留下后续的间隔层,然后刻蚀未被硬掩模覆盖的下一层以及随后的步骤重复间隔物,直到蚀刻完MTJ堆叠的所有层以完成MTJ结构为止。

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