首页> 外国专利> SYSTEM FOR MONITORING TEMPERATURE AND HUMIDITY STATE INSIDE WAFER CARRIER USING TEMPERATURE AND HUMIDITY SENSOR BASED ON SHORT-DISTANCE WIRELESS COMMUNICATION AND METHOD THEREOF

SYSTEM FOR MONITORING TEMPERATURE AND HUMIDITY STATE INSIDE WAFER CARRIER USING TEMPERATURE AND HUMIDITY SENSOR BASED ON SHORT-DISTANCE WIRELESS COMMUNICATION AND METHOD THEREOF

机译:基于短距离无线通信的利用温度和湿度传感器监测晶片载体内部温度和湿度状态的系统及其方法

摘要

The present invention relates to a system for monitoring the temperature and a humidity state inside a wafer carrier. More particularly, the system comprises: an environmental state measurement unit mounted in each wafer carrier and measuring a temperature and humidity state therein; an environmental state data collection unit provided at each predetermined point on a moving line of the wafer carrier to collect temperature and humidity data measured through a short-range wireless communication connection from the environmental state measurement unit of the adjacent wafer carrier; and an environmental condition monitoring unit which receives the temperature and humidity data from each environmental state data collection unit and monitors the temperature and humidity state inside each wafer carrier based on the temperature and humidity data.;COPYRIGHT KIPO 2020
机译:本发明涉及一种用于监视晶片载体内部的温度和湿度状态的系统。更具体地说,该系统包括:环境状态测量单元,其安装在每个晶片载体中并测量其中的温度和湿度状态;以及环境状态数据收集单元,其设置在晶片载体的移动线上的每个预定点处,以从相邻的晶片载体的环境状态测量单元收集通过短程无线通信连接测量的温度和湿度数据; COPYRIGHT KIPO 2020;以及环境条件监视单元,其从每个环境状态数据收集单元接收温度和湿度数据,并基于该温度和湿度数据监视每个晶片载体内部的温度和湿度状态。

著录项

  • 公开/公告号KR20200048269A

    专利类型

  • 公开/公告日2020-05-08

    原文格式PDF

  • 申请/专利权人 SHIM SANG KOOK;

    申请/专利号KR20180130172

  • 申请日2018-10-29

  • 分类号H01L21/67;G01D21/02;H01L21/673;

  • 国家 KR

  • 入库时间 2022-08-21 11:07:12

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