Initiation and monitoring of the progress of single electrons in atomic regulatory structures

摘要

Performing scanning tunnel microscopy hydrogen lithography with a scanning probe microscope to form a charged structure having one or more localized charges; Performing a series of free-field electron force microscopic measurements at different tip heights on the charged structure, where the interaction between the tip and localized charge is identified; A method of patterning and controlling single electrons on a surface is provided, including adjusting the tip heights to position the charges in a controlled state within the structures to write a predetermined charged state. The present invention also provides a Gibbs probability distribution machine configured by a method of patterning and controlling single electrons on a surface. A multi-bit true random number generator and neural network learning hardware configured in the above-described method are also provided.