首页> 外国专利> Normal-incidence and non-normal-incidence combination ellipsometer and method for measuring optical properties of the sample using the same

Normal-incidence and non-normal-incidence combination ellipsometer and method for measuring optical properties of the sample using the same

机译:正入射和非正入射组合椭偏仪及使用其的样品光学性能测量方法

摘要

The present invention relates to an ellipsometer combined with vertical incidence and oblique incidence and a method for measuring the mineral properties of a specimen using the same. An object of the present invention is to replace the wavelength-dependent compensator with a linearly polarized wavelength-independent compensator in the vertical incident ellipsometer structure, thereby simplifying the calibration procedure of the instrument and at the same time making it easy to realize the measurement wavelength region expansion. , To provide a combined vertical and inclined incident ellipsometer and a method for measuring the mineral properties of a specimen using the same. Another object of the present invention, by measuring the mineral properties using an ellipsometer in the form of a combination of a vertical incidence-type ellipsometer and an inclined-incidence ellipsometer, the reliability of the analysis results by obtaining more measurement values for the specimen in various ways It is to provide a method for measuring the mineral properties of a specimen using the ellipsometer combined with a vertical incidence and an inclined incidence, which enables the improvement of.
机译:椭圆仪技术领域本发明涉及一种结合垂直入射和倾斜入射的椭圆仪以及使用该椭圆仪测量样品的矿物性质的方法。本发明的一个目的是在垂直入射椭圆仪结构中用线性偏振的与波长无关的补偿器代替与波长有关的补偿器,从而简化了仪器的校准程序,同时使实现测量波长变得容易。区域扩张。提供一种组合的垂直和倾斜入射椭圆仪以及一种使用该椭圆仪测量样品的矿物性能的方法。本发明的另一个目的是,通过使用垂直入射型椭圆仪和倾斜入射椭圆仪的形式的椭圆仪测量矿物性质,通​​过获得更多样品的测量值来分析结果的可靠性。提供一种使用椭圆仪结合垂直入射角和倾斜入射角来测量样品的矿物性能的方法,该方法能够改善这种情况。

著录项

  • 公开/公告号KR102139995B1

    专利类型

  • 公开/公告日2020-07-31

    原文格式PDF

  • 申请/专利权人 한국표준과학연구원;

    申请/专利号KR20180127708

  • 发明设计人 조용재;제갈원;조현모;

    申请日2018-10-24

  • 分类号G01N21/21;

  • 国家 KR

  • 入库时间 2022-08-21 11:04:03

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