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QUANTITATIVE ANALYTIC METHOD FOR ANTIMON OR CADMIUM

机译:痕量或镉的定量分析方法

摘要

The present invention comprises the steps of preparing talc powder, which is a blank powder standard sample; Adding antimony or cadmium to talc powder to prepare a standard powder sample of two or more different concentrations; Selecting an interference element whose energy value is within the range of the detected energy value of antimony or cadmium from among the detected winsos by irradiating X-rays on the analysis sample; Deconvolution of correcting the detection energy peak of antimony or cadmium from the detected energy peak of the overlapping interference element among the energy peaks detected by irradiating X-rays to the powder standard sample for each concentration in the step of selecting the interference element ( deconvolution) step; Preparing a standard calibration curve by performing the deconvolution step after irradiating each of the prepared powder standard samples for each concentration with X-rays; And measuring the concentration of antimony or cadmium in the analysis sample according to a standard calibration method using a standard calibration curve prepared by irradiating X-rays on the analysis sample to detect the energy peak, and then measuring the detected energy peak value by a standard calibration curve. It relates to a method for quantitative analysis of cadmium.
机译:本发明包括制备作为空白粉末标准样品的滑石粉的步骤。在滑石粉中添加锑或镉以制备两种或两种以上不同浓度的标准粉末样品;通过在分析样品上照射X射线,从检测到的钨中选择能量值在锑或镉的检测能量值的范围内的干扰元素;在选择干扰元素的步骤中,针对每种浓度,通过对粉末标准样品进行X射线照射而检测到的能量峰中,从重叠干扰元素的检测能量峰中对锑或镉的检测能量峰进行校正以进行反卷积(去卷积)步;在用X射线照射每种浓度的制备好的粉末标准样品后,通过执行去卷积步骤来制备标准校准曲线;然后,根据标准校准方法,通过使用标准校准曲线测量分析样品中锑或镉的浓度,该标准校准曲线是通过在分析样品上照射X射线以检测能量峰值而制成的,然后通过标准测量检测到的能量峰值校准曲线。本发明涉及一种镉的定量分析方法。

著录项

  • 公开/公告号KR102152654B1

    专利类型

  • 公开/公告日2020-09-09

    原文格式PDF

  • 申请/专利权人 (주)아모레퍼시픽;

    申请/专利号KR20140152131

  • 申请日2014-11-04

  • 分类号G01N23/223;G01N1/28;G01N1/30;G01N33/02;G01N33/15;G01N33/20;

  • 国家 KR

  • 入库时间 2022-08-21 11:03:54

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