首页> 外国专利> METHOD FOR EVALUATING RECEPTIVITY OF ENDOMETRIUM IN SECRETORY PHASE IN WOMEN WITH PRIMARY INFERTILITY CAUSED BY ENDOMETRIAL HYPOPLASIA

METHOD FOR EVALUATING RECEPTIVITY OF ENDOMETRIUM IN SECRETORY PHASE IN WOMEN WITH PRIMARY INFERTILITY CAUSED BY ENDOMETRIAL HYPOPLASIA

机译:子宫内膜异位症导致原发性不育的女性子宫内膜子宫内膜异位率的评估方法

摘要

FIELD: medicine.;SUBSTANCE: invention refers to medicine, particularly to pathomorphology, obstetrics and gynecology. Disclosed is a method of assessing endometrial receptivity in a secretory phase of a cycle in females suffering a uterine infertility caused by endometrial hypoplasia, in which by immunohistochemical method, p53 and PTEN receptor expression is determined in glands and stroma, followed by calculating prognostic index (PI) by formula PI=X1×-0.69+0.59×X2+0.99×X3+0.37×X4-69.3. If PI is more than 0, a conclusion is made on the endometrium's readiness for successful implantation of the embryo and possibility of directing the woman into the high-tech reproductive technologies (HRT) program. If PI is less than 0, low endometrial receptiveness and high risk of reproductive failure in HRT programs in women with primary infertility caused by endometrial hypoplasia are predicted.;EFFECT: invention provides more effective prediction of reproductive failures in females with endometrial hypoplasia and uterine infertility.;1 cl, 1 tbl, 3 ex
机译:技术领域本发明涉及医学,尤其是病理形态学,妇产科。公开了一种评估子宫内膜发育不全导致子宫不育的女性在周期分泌阶段的子宫内膜容受性的方法,该方法通过免疫组织化学方法确定了腺体和基质中p53和PTEN受体的表达,然后计算了预后指标( PI)通过公式PI = X1×-0.69 + 0.59×X2 + 0.99×X3 + 0.37×X4-69.3。如果PI大于0,则表明子宫内膜已准备好成功植入胚胎,并有可能引导该妇女进入高科技生殖技术(HRT)计划。如果PI小于0,则预测由子宫内膜发育不全引起的原发性不育女性的HRT程序中子宫内膜的接受度低和生殖衰竭的高风险。效果:本发明提供了对子宫内膜发育不全和子宫不育的女性生殖衰竭的更有效的预测。 。; 1 cl,1 tbl,3 ex

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