首页> 外国专利> METHOD FOR MEASURING GEOMETRIC PARAMETERS AND / OR PATTERN DEFORMING UNDER THE INFLUENCE OF HIGH TEMPERATURE AND A SYSTEM FOR IMPLEMENTING THE METHOD

METHOD FOR MEASURING GEOMETRIC PARAMETERS AND / OR PATTERN DEFORMING UNDER THE INFLUENCE OF HIGH TEMPERATURE AND A SYSTEM FOR IMPLEMENTING THE METHOD

机译:高温影响下几何参数和/或图形变形的测量方法及实现该方法的系统

摘要

The invention relates to measuring devices, in particular non-contact means and methods for measuring the parameters of the deformation of objects. The technical result to which the invention relates is the possibility of non-contact measurement of deformations of a loaded sample (even if the stress state is complex) and its shape at high temperatures (up to 700 ° C, up to an annealing temperature) by generation and processing the numerical image of the object to be examined (including its shape, deformations in different zones and coordinates of points), while reducing the complexity of the measurements and achieving a high accuracy of the parameters of the deformation of the object obtained.
机译:本发明涉及测量装置,特别是用于测量物体变形参数的非接触装置和方法。本发明涉及的技术结果是有可能以非接触方式测量加载的样品的变形(即使应力状态复杂)及其在高温(高达700°C,高达退火温度)下的形状。通过生成和处理要检查的对象的数值图像(包括其形状,不同区域的变形和点的坐标),同时降低了测量的复杂性并实现了获得的对象变形参数的高精度。

著录项

  • 公开/公告号DE112018002883T5

    专利类型

  • 公开/公告日2020-03-12

    原文格式PDF

  • 申请/专利权人 VALENTIN VIKTOROVICH TERAUD;

    申请/专利号DE20181102883T

  • 发明设计人 VALENTIN VIKTOROVICH TERAUD;

    申请日2018-03-27

  • 分类号G01C11/06;G01B11/16;

  • 国家 DE

  • 入库时间 2022-08-21 11:01:34

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