Method for the localization of signal sources in localization microscopy

摘要

The invention relates to a method in localization microscopy for localizing signal sources (3.1, 3.2). In this case, values of an error parameter are determined at least once for each pixel (1) of a detector (2) and assigned to the relevant pixel (2) and stored in a calibration data set. Original areas (4) of signal sources (3.1, 3.2) are identified on the basis of captured image data and a point distribution function is adapted to the pixel values of the respective original areas (4). The respective signal source (3.1, 3.2) is localized using the point distribution function. The pixel-specific error parameter of each pixel (1) can be compared with a threshold value. If the threshold value is exceeded, these pixels (1) are either ignored or replaced by interpolation when adapting the point distribution function. Additionally or alternatively, the real noise behavior of the pixels (1) is determined and corrected on the basis of derived pixel-specific error parameters.