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Systems and methods for in situ high temperature X-ray spectroscopy in electron microscopes

摘要

In some embodiments, a system for collecting information from a sample includes a sample stage and one or more signal detectors. The sample stage includes a heating element, and the heating element is capable of heating at least a portion of the sample stage to at least 100 Celsius. The one or more signal detectors has a detection material with a silicon nitride window positioned between the detection material and the sample stage.

著录项

  • 公开/公告号US10656106B2

    专利类型

  • 公开/公告日2020.05.19

    原文格式PDF

  • 申请/专利权人

    申请/专利号US16268251

  • 发明设计人 Patrick Paul Camus;

    申请日2019.02.05

  • 分类号

  • 国家 US

  • 入库时间 2022-08-21 10:59:25

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