PROCÉDÉ D'APPRENTISSAGE ET DISPOSITIF D'APPRENTISSAGE POUR CNN UTILISANT LA CONVOLUTION 1XK OU KX1 À UTILISER POUR L'OPTIMISATION DE MATÉRIEL ET PROCÉDÉ DE TEST ET DISPOSITIF DE TEST LES UTILISANT

摘要

A method for learning parameters of a CNN using a 1×K convolution operation or a K×1 convolution operation is provided to be used for hardware optimization which satisfies KPI. The method includes steps of: a learning device (a) instructing a reshaping layer to two-dimensionally concatenate features in each group comprised of corresponding K channels of a training image or its processed feature map, to thereby generate a reshaped feature map, and instructing a subsequent convolutional layer to apply the 1 xK or the Kx1 convolution operation to the reshaped feature map, to thereby generate an adjusted feature map; and (b) instructing an output layer to refer to features on the adjusted feature map or its processed feature map, and instructing a loss layer to calculate losses by referring to an output from the output layer and its corresponding GT.