DISPOSITIF POUR DETERMINER UNE VALEUR DE CONTRAINTE CORRESPONDANT A UN PIC DE LA CONTRAINTE ET PROCEDE DE DETERMINATION DE CONTRAINTE

摘要

The device (1) comprises at least one stress sensor (2) comprising a piezoresistive element (3) and a piezoelectric element (4) capable of generating an electrical signal when a stress is applied to the stress sensor (2). The device (1) comprises a detector (5) configured to detect a peak of the stress applied to the stress sensor (2) by processing the electrical signal. The device (1) is configured to trigger, when the peak of the applied stress is detected by the detector (5), a measurement of an electrical quantity representative of an electrical resistance of the piezoresistive element (3) of the sensor. constraint (2). The device (1) is configured to determine a value of the stress applied to the stress sensor (2) using the measured electrical quantity.