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PROCÉDÉ DE FABRICATION D'UN DISPOSITIF À SEMICONDUCTEUR BASÉ SUR UNE TECHNOLOGIE CMOS SUR MICROHOTPLATE

摘要

It is disclosed herein a semiconductor device and a method of manufacturing the semiconductor device. The semiconductor device is made using partly CMOS or CMOS based processing steps, and it includes a semiconductor substrate, a dielectric region over the semiconductor substrate, a heater within the dielectric region and a patterned layer of noble metal above the dielectric region. The method includes the deposition of a photoresist material over the dielectric region, and patterning the photo-resist material to form a patterned region over the dielectric region. The steps of depositing the photo-resist material and patterning the photo-resist material may be performed in sequence using similar photolithography and etching steps to those used in a CMOS process. The resulting semiconductor device is then subjected to further processing steps which ensure that a dielectric membrane and a metal structure within the membrane are formed in the patterned region over the dielectric region.

著录项

  • 公开/公告号EP3114467B1

    专利类型

  • 公开/公告日2020.07.08

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP15707746.2

  • 发明设计人

    申请日2015.02.27

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:50

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