首页> 外国专利> PROCÉDÉ DE MESURE PAR FLUORESCENCE ACTIVÉE PAR PLASMONS DE SURFACE ET DISPOSITIF DE MESURE PAR FLUORESCENCE ACTIVÉE PAR PLASMONS DE SURFACE

PROCÉDÉ DE MESURE PAR FLUORESCENCE ACTIVÉE PAR PLASMONS DE SURFACE ET DISPOSITIF DE MESURE PAR FLUORESCENCE ACTIVÉE PAR PLASMONS DE SURFACE

摘要

First, an analytical chip having a prism, a metal film that includes a trapping region having immobilized on the surface thereof a trapping element for trapping a substance to be analyzed, and a mark in which the scatter of emitted plasmon scattered light differs from the scatter of plasmon scattered light emitted from the surrounding region, is disposed in a chip holder. Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. Next, the portion of the rear surface of the metal film that corresponds to the trap region arranged at the detected location is irradiated with excitation light, and fluorescence emitted by a fluorescent substance is detected.

著录项

  • 公开/公告号EP3153845B1

    专利类型

  • 公开/公告日2020.05.27

    原文格式PDF

  • 申请/专利权人 Konica Minolta, Inc.;

    申请/专利号EP15799969.9

  • 发明设计人

    申请日2015.05.29

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:26

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