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ÉBAUCHE DE PHOTOMASQUE ET PROCÉDÉ DE FABRICATION D'UN PHOTOMASQUE

摘要

A photomask blank for a material of a photomask used in pattern transfer by exposure light having a wavelength of up to 250nm, including a transparent substrate, a chromium-containing film directly formed on the substrate or formed with an optical film intervened between the transparent substrate and the chromium-containing film. The chromium-containing film includes a region (A) composed of a chromium compound containing chromium, oxygen and carbon, wherein each of contents of the elements contained in the chromium compound is continuously varied in the thickness direction of the region (A), and toward the substrate, the content of chromium increases, and the content of carbon decreases.

著录项

  • 公开/公告号EP3667416A1

    专利类型

  • 公开/公告日2020.06.17

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP19211441.1

  • 发明设计人

    申请日2019.11.26

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:21

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