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PROCÉDÉ ET SYSTÈME POUR ACQUÉRIR DES MESURES D'OSCILLOMÉTRIE

摘要

A method for acquiring oscillometry measurements with an oscillometry measuring system comprises receiving oscillometry measurements, using at least one processor of the oscillometry measuring system, the oscillometry measurements being from at least one oscillometry recording. Parameters are identified in the oscillometry measurements. An objective function(s) is calculated from the parameters of the oscillometry measurements. The objective function(s) is evaluated as a function of at least one predetermined threshold. The oscillometry measurements are accepted or rejected from the evaluating. Oscillometry data is output using the oscillometry measurements if accepted from the evaluating. A system for acquiring oscillometry measurements is also provided.

著录项

  • 公开/公告号EP3658021A1

    专利类型

  • 公开/公告日2020.06.03

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP18839161.9

  • 发明设计人

    申请日2018.07.26

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:18

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