A method of imaging a given element in a given material, comprising: a) acquiring diffraction patterns of a plurality of locations of a given area of the sample by scanning with a d-beam electrons or X-rays of said area, b) determining an atomistic model between the given element and the given material, c) choosing a plurality of elementary detectors, d) calculating, for each elementary detector , images, in real space obtained from atomic models with and without elements, e) calculation for each elementary detector of the difference between images in real space obtained from atomistic models with and without elements, said first images, f) the selection of images from the first images, on which there is a strong contrast in the vicinity of the given element, g) The combination of the selected images to form a second image of the given element in the given material.
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