首页> 外国专利> DISPOSITIF D'ANALYSE DE MICROPARTICULES, PROCÉDÉ D'ANALYSE DE MICROPARTICULES, PROGRAMME, ET SYSTÈME D'ANALYSE DE MICROPARTICULES

DISPOSITIF D'ANALYSE DE MICROPARTICULES, PROCÉDÉ D'ANALYSE DE MICROPARTICULES, PROGRAMME, ET SYSTÈME D'ANALYSE DE MICROPARTICULES

摘要

Provided are a fine particle analyzing apparatus, a fine particle analyzing method, a program, and a fine particle analyzing system, which are capable of easily separating a plurality of types of spectral data on fluorescence emitted from a fine particle. A data extracting unit included in the fine particle analyzing apparatus selectively extracts spectral data, which contain predetermined information, from spectral data on fluorescence emitted from a fine particle. The data extracting unit selectively extracts spectral data indicating the maximum intensity in a wavelength area set beforehand from one or a plurality of types of spectral data indicating intensity of fluorescence emitted from the fine particle for each of a plurality of wavelengths.

著录项

  • 公开/公告号EP2975384B1

    专利类型

  • 公开/公告日2020.06.24

    原文格式PDF

  • 申请/专利权人 Sony Corporation;

    申请/专利号EP14764179.9

  • 发明设计人

    申请日2014.02.19

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:07

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号