首页> 外文OA文献 >Dynamics of charge carriers in bismuth vanadate photoanodes for water splitting using solar energy
【2h】

Dynamics of charge carriers in bismuth vanadate photoanodes for water splitting using solar energy

机译:钒酸铋光阳极中电荷载体的动力学分析

摘要

This thesis described an investigation of charge carrier dynamics in dense, flat bismuth vanadate (BiVO4) photoanodes using transient absorption spectroscopy and photoelectrochemical measurements including transient photocurrents. Transient absorption spectroscopy was employed to probe directly the photogenerated charge carrier population change as a function of time from microsecond (μs) to second (s) timescales. Transient photocurrent measurements were used to monitor charge extraction under chopped light conditions. Photo-induced absorption spectroscopy was employed to investigate charge carriers under working photo-electrochemical (PEC) conditions.udThe transient absorption signals due to photogenerated holes in BiVO4 were determined through using electron/hole scavengers and applied electrical bias in a complete photoelectrochemical cell. In ‘un-doped’ BiVO4, photogenerated holes were found to absorb from 500 nm to 900 nm. The dynamics of photogenerated holes were studied as a function of applied potential and excitation intensity. The population of long-lived (milliseconds–seconds) holes increased with increasing the width of space charge layer as a function of applied potential. A recombination process in kinetic competition with water oxidation on these long timescales was found to limit the photocurrent amplitude and onset potential in un-doped BiVO4 photoanodes. Using transient photocurrent measurements, this recombination process was identified as recombination of surface-accumulated holes with electrons from the bulk of the semiconductor (back electron/hole recombination). udDoping molybdenum (MoVI) in un-doped BiVO4 has been reported to be an effective method to increase photocurrent amplitude. Impedance measurements were carried out to determine the donor density increased by the presence of MoVI doping. The increased donor density limited efficient generation of the space charge layer to retard fast recombination on microseconds to milliseconds timescales, thus limiting the long-lived hole yield under modest applied potentials. MoVI dopants were shown to improve the electron transport determined by front/back side illumination in PEC and transient absorption spectroscopy (TAS) measurements. udCobalt phosphate (CoPi) surface-modified un-doped BiVO4 photoanodes were also studied using transient absorption spectroscopy and transient photocurrent measurements. Transient absorption spectra of CoPi-modified BiVO4 were similar to those of unmodified BiVO4, and the kinetics on milliseconds to seconds did not change in the presence of CoPi surface modification. Both results indicated that photogenerated holes in BiVO4 rather than CoPi species were monitored by transient absorption spectroscopy. However, the negative shift of photocurrent onset and increased photocurrent could be explained by efficient suppression of back electron/hole recombination in BiVO4 photoanodes. udIn terms of the function of CoPi water oxidation catalysts on BiVO4, photo-induced absorption (PIA) was employed to further study the CoPi/BiVO4 system. CoPi species oxidised by BiVO4 holes were observed in PIA measurements due to the high extinction coefficient of oxidised CoPi and significant hole accumulation generated by continuous illumination. However, these oxidised CoPi species did not appear to drive catalytic water oxidation, as evidenced by results from spectroelectrochemical measurements of CoPi/FTO electrodes; water oxidation still occurred via BiVO4, consistent with the transient absorption results. Therefore, I concluded that in the CoPi/BiVO4 system, CoPi did not act as a catalyst, although hole transfer to CoPi can take place.
机译:本文介绍了瞬态吸收光谱法和包括瞬态光电流在内的光电化学测量方法,研究了致密,扁平的钒酸铋(BiVO4)光阳极中载流子动力学的研究。瞬态吸收光谱用于直接探测光生电荷载流子的数量变化,该变化是时间从微秒(μs)到秒(s)时标的函数。瞬态光电流测量用于监视在切碎的光条件下的电荷提取。使用光诱导吸收光谱法研究在工作光电化学(PEC)条件下的载流子。 ud通过使用电子/空穴清除剂并在完整的光电化学电池中施加电偏压来确定BiVO4中光生空穴引起的瞬态吸收信号。在“未掺杂” BiVO4中,发现光生空穴吸收了500 nm至900 nm。研究了光生空穴的动力学与施加电势和激发强度的关系。长寿命(毫秒-秒)的空穴随着空间电荷层宽度的增加而增加,这是施加电势的函数。在这些长的时间尺度上,与水氧化的动力学竞争中的重组过程被发现限制了未掺杂的BiVO4光阳极中的光电流幅度和起始电位。使用瞬态光电流测量,这种复合过程被识别为表面积聚的空穴与大部分半导体中的电子复合(反向电子/空穴复合)。据报道,在未掺杂的BiVO4中掺杂钼(MoVI)是增加光电流幅度的有效方法。进行阻抗测量以确定由于存在MoVI掺杂而增加的供体密度。施主密度的增加限制了空间电荷层的有效生成,从而延迟了微秒至毫秒时间尺度上的快速复合,从而限制了适度施加电势下的长寿命空穴产率。 MoVI掺杂剂可改善PEC中的正面/背面照明和瞬态吸收光谱(TAS)测量确定的电子传输。还使用瞬态吸收光谱法和瞬态光电流测量技术研究了磷酸钴(CoPi)表面改性的未掺杂BiVO4光阳极。 CoPi修饰的BiVO4的瞬态吸收光谱与未修饰的BiVO4相似,并且在CoPi表面修饰的情况下,毫秒到秒的动力学不变。两项结果均表明,通过瞬态吸收光谱法监测了BiVO4而非CoPi物种中的光生空穴。但是,可以通过有效抑制BiVO4光阳极中的反向电子/空穴复合来解释光电流开始的负向偏移和光电流增加。关于CoPi水氧化催化剂对BiVO4的作用,采用光诱导吸收(PIA)进一步研究CoPi / BiVO4系统。在PIA测量中观察到BiVO4空穴氧化的CoPi物种,因为氧化的CoPi的高消光系数和连续照明产生的大量空穴积累。然而,由CoPi / FTO电极的光谱电化学测量结果证明,这些氧化的CoPi物质似乎没有推动催化水氧化。 BiVO4仍会发生水氧化,这与瞬态吸收结果一致。因此,我得出的结论是,在CoPi / BiVO4系统中,尽管可以将空穴转移到CoPi,但CoPi并未充当催化剂。

著录项

  • 作者

    Ma Yimeng;

  • 作者单位
  • 年度 2015
  • 总页数
  • 原文格式 PDF
  • 正文语种
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号