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Defective Pixel Correction

机译:像素校正不良

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摘要

When using CMOS technology for image sensors, there is a possibility that any givenpixel is defective and will thus produce a value that does not correlate to the amount oflight it was subject to. As such, the processing unit will calculate a value that diersfrom the value produced if the transistor was working correctly. Having a pixel with adefective value can manifest itself as a light spot or a dark spot depending on whether thetransistor for that pixel is on or o. In some areas where the value of the defective pixeldoes not dier greatly from its neighbors, the image will not appear as degraded in theeyes of the viewer as if the defective value was in great contrast to its surroundings.Theability to compensate for the defective pixels with an algorithm will result in a morerobust device that is not required to function perfectly in order to produce an image. Italso translates into prot as a company can sell image sensors that would otherwise havebeen discarded by testing procedures.This report is organized with chapter 1 providing the introduction to the assignment interms of the nature of defective pixels and also creating a context with explanation asto why it is an important aspect of manufacturing image sensors .Chapter 2 describesthe development board that is utilized and how an embedded system can utilize a vhdlperipheral. It also shows what components will go into making an embedded system withthe required functionality. The theory behind components and techniques used in thisproject is in chapter 3. The vhdl les to be added to a peripheral so that they can beaccessed by the cpu, and the architectures of the vhdl les and microblaze are placedin chapter 4. Chapter 5 contains the simulations of the input images with dierentnoise levels and threshold levels in addition to tests designed to determine the embeddedsystems functional ability.The vhdl les and the microblaze systems are synthesized withthe resulting numbers revealed in chapter 6. The tools used in this project are listedin chapter 7 with their version number. Chapter 8 contains discussions regarding theresults and techniques in this project. The concluding remarks and the further work forthe project are in chapter 9 and 10, respectively. A list of terms will explain abbreviationsused in this report.i
机译:当将CMOS技术用于图像传感器时,任何给定的像素都有可能出现缺陷,从而产生的值与其所承受的光量不相关。这样,如果晶体管工作正常,则处理单元将计算出与产生的值不同的值。像素值具有完好性的像素可以根据亮点还是暗点而表现为亮点或暗点,具体取决于该像素的晶体管是开还是灭。在某些缺陷像素的值与相邻像素差异不大的区域中,图像在观看者的眼中不会像缺陷值与其周围环境形成鲜明对比那样显示出劣化的图像。一种算法将产生一种更强大的设备,为了产生图像,该设备不需要完美运行。由于该公司可以出售原本会被测试程序丢弃的图像传感器,因此它也转化为利润。本报告由第一章组成,介绍了缺陷像素的性质的分配术语,并提供了解释其原因的上下文这是制造图像传感器的重要方面。第2章介绍了所使用的开发板以及嵌入式系统如何利用甚高外围设备。它还显示了具有所需功能的嵌入式系统将使用哪些组件。本项目中使用的组件和技术背后的理论在第3章中。将vhdl文件添加到外围设备以便cpu可以访问它们,而vhdl文件和microblaze的体系结构放在第4章中。除了确定嵌入式系统功能性的测试外,还模拟了具有不同噪声水平和阈值水平的输入图像。合成了vhdl les和microblaze系统,并在第6章中揭示了所得的数字。该项目中使用的工具在第7章中列出。及其版本号。第8章包含有关该项目的结果和技术的讨论。结束语和该项目的进一步工作分别在第9章和第10章中。术语列表将解释本报告中使用的缩写词。

著录项

  • 作者

    Backe-Hansen Henrik;

  • 作者单位
  • 年度 2010
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类

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