Optical Metrology for Industrialization of Optical Information Processing

摘要

One of the major barriers to commercial application of optical technology toinformation processing is the high cost of system development and manufacture. This problem has been solved in other industries through the use of CAD and integration of system design with manufacturing. The development of better system metrology is needed to allow more computer based methods to be used in this process. As a test case, we are designing an optical pattern recognition system to be performed on an input image (at video rates) verses a large reference set, for example 1000 faces, with images of at lease 640 by 480 pixels size. This report documents some of the technical issues involved.