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A Novel, High Resolution, Non-Contact Channel Temperature Measurement Technique

机译:一种新颖的高分辨率非接触通道温度测量技术

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摘要

An in-situ optical technique based on infrared emission spectroscopy has been developed for non-contact measurement of the temperature of a hot spot in the gate channel of a GaAs metal/semiconductor field effect transistor (MESFET).

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