High precision Woelter optic calibration facility

摘要

We have developed an off-line facility for very precise characterization of the reflectance and spatial resolution of the grazing incidence Woelter Type 1 x-ray optics used at Nova. The primary component of the facility is a high brightness, ''point'' x-ray source consisting of a focussed DC electron beam incident onto a precision manipulated target/pinhole array. The data are recorded with a selection of detectors. For imaging measurements we use direct exposure x-ray film modules or an x-ray CCD camera. For energy-resolved reflectance measurements, we use lithium drifted silicon detectors and a proportional counter. An in situ laser alignment system allows precise location and rapid periodic alignment verification of the x-ray point source, the statically mounted Woelter optic, and the chosen detector.