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Initial tests of the dual-sweep streak camera system planned for APS particle-beam diagnostics

机译:计划用于aps粒子束诊断的双扫描条纹相机系统的初始测试

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Initial tests of a dual-sweep streak system planned for use on the Advanced Photon Source (APS) have been performed using assets of the Argonne Wakefield Accelerator (AWA) facility. The short light pulses from the photoelectric injector drive laser in both the visible ((lambda)=496 nm, (Delta)t(approximately)1.5 ps (FWHM)), and the ultraviolet ((lambda)=248 nm, (Delta)t(approximately)5 ps (FWHM)) were used. Both a UV-visible S20 photocathode streak tube and a UV-to-x-ray Au photocathode streak tube were tested. Calibration data with an etalon were also obtained. A sample of dual-sweep streak data using optical synchrotron radiation on the APS injector synchrotron is also presented.

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