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INITIAL TESTS OF THE DUAL-SWEEP STREAK CAMERA SYSTEM PLANNED FOR APS PARTICLE-BEAM DIAGNOSTICS

机译:用于APS粒子束诊断的双扫描条纹相机系统的初始测试

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Initial tests of a dual-sweep streak system planned for use on the Advanced Photon Source (APS) have been performed using assets of the Argonne Wakefield Accelerator (AWA) facility. The short light pulses from the photoelectric injector drive laser in both the visible (λ=496 nm, Δt~1.5 ps (FWHM)), and the ultraviolet (λ= 248 nm, Δt~5 ps (FWHM)) were used. Both a UV-visible S20 photocathode streak tube and a UV-to-x-ray Au photocathode streak tube were tested. Calibration data with an etalon were also obtained. A sample of dual-sweep streak data using optical synchrotron radiation on the APS injector synchrotron is also presented.
机译:已计划使用Argonne Wakefield Accelerator(AWA)设施的资产对计划用于高级光子源(APS)的双扫频条纹系统进行初始测试。在可见光(λ= 496 nm,Δt〜1.5 ps(FWHM))和紫外线(λ= 248 nm,Δt〜5 ps(FWHM))中均使用了来自光电注入器驱动激光器的短光脉冲。测试了紫外线可见S20光电阴极条纹管和紫外线X射线金Au光电阴极条纹管。还获得了带有标准具的校准数据。还介绍了使用APS喷油器同步加速器上的光学同步加速器辐射进行的双扫频数据示例。

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