Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors

摘要

Of the many methods used to focus x-rays, the use of mirrors with an elliptical curvature shows the most promise of providing a sub-micron white light focus. Our group has been developing the techniques of controlled bending of mirror substrates in order to produce the desired elliptical shape. We have been successful in producing surfaces with the required microradian slope error tolerances. Details of the bending techniques used, results from laboratory slope error measurements using a Long Trace Profiler (LTP) and data from the measurement of focus shape using knife edge and imaging methods using x-rays in the 5-12 KeV energy range are presented. The development of a white light focusing opens many possibilities in diffraction and spectroscopic studies.