Electron microscopy analysis of the intermediate phases formed during thenucleation of yba(sub 2)cu(sub 3)o(sub 7-(delta)) film

摘要

Recently, considerable efforts have been made in growing bi-axially aligned thickYBa(sub 2)Cu(sub 3)O(sub 7) (YBCO) films on a flexible, textured metallic substrate for electrical power applications. The BaF(sub 2) post-deposition annealing process is one of the most promising methods. To understand the nucleation and growth mechanism of YBCO in this process, extended transmission electron microscopy analysis has been made. Here, we report on the evolution of Ba-Y oxy-fluoride which is pertinent to the epitaxial YBCO nucleation process on SrTiO(sub 3) (STO) substrate.