首页> 美国政府科技报告 >Effects of 2D and Finite Density Fluctuations on O-X Correlation Reflectometry
【24h】

Effects of 2D and Finite Density Fluctuations on O-X Correlation Reflectometry

机译:二维和有限密度波动对O-X相关反射计的影响

获取原文

摘要

The correlation between O-mode and X-mode reflectometer signals is studied with a 1D and 2D reflectometer model in order to explore its feasibilities as a q-profile diagnostic. It was found that 2D effects and finite fluctuation levels both decrease the O-X correlation. At very low fluctuation levels, which are usually present in the plasma core, there is good possibility to determine the local magnetic field strength and use that as a constraint for the equilibrium reconstruction.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号