Simulation of Secondary Electron Emission Based on a Phenomenological Probabilistic Model

摘要

We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary emission yield (SEY) and the emitted-energy spectrum. We provide two sets of values for the parameters by fitting our model to two particular data sets, one for copper and the other one for stainless steel. We also present details of the electron-cloud simulation code POSINST that are relevant to the secondary emission process. This note expands on our previously published article.