Optimization of Phase-Contrast Enhanced X-Ray Imaging of D-T Layers

摘要

Phase-contrast enhanced x-ray imaging has been demonstrated for characterization of D-T layers inside of beryllium shells. These first demonstrations used both scintillator and direct-detection imaging. This memo details tradeoffs between the two methods in order to optimize the imaging. The guiding principle for optimization is to minimize the exposure time while maximizing the signal-to-noise ratio at the D-T solid-vapor interface. Direct-detection and scintillator performance are comparable when imaging the full capsule. However, a scintillator allows for higher-resolution images necessary for studying local defects in the D-T layer.