High-Precision Thickness Measurements Using beta Backscatter

摘要

A two-axis, automated fixture for use with a high-intensity Pm-147 source and a photomultiplier-scintillation beta-backscatter probe for making thickness measurements has been designed and built. A custom interface was built to connect the system to a minicomputer, and software was written to position the tables, control the probe, and make the measurements. Measurements can be made in less time with much greater precision than by the method previously used. (ERA citation 04:027686)