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Modification of a Secondary Ion Mass Spectrometer to Allow the Examination of Highly Radioactive Specimens

机译：二次离子质谱仪的改进，以允许高放射性标本的检查

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摘要

The Secondary Ion Mass Spectrometry, SIMS, is a powerful new technique for elemental surface and in-depth analysis. The Swiss Federal Institute for Reactor Research (EIR) has modified a commerical SIMS to allow the handling of highly alpha and beta / gamma active specimens. The detailed modifications, shielding and commissioning of the apparatus are summarized. (Atomindex citation 13:654293)

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作者
Bart, G.; Aerne, T.; Flueckiger, U.; Sprunger, E.;
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年度 1980
页码 1-20
总页数 20
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Mass spectrometers; Radioactive materials; Radioassay; Secondary emission; Shielding; Specifications; Ion microprobe analysis; Mass spectroscopy; Design;

机译：质谱仪;放射性物质;放射性测定;二次发射;屏蔽;规格;离子微探针分析;质谱;设计;

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机译：部分〜1。产生铯（+）和碘（-）离子的双离子源，用于二次离子质谱分析。第二部分用反射飞行时间质谱仪研究基质辅助激光解吸。
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机译：在放射性污染实验室中用于分析DOE放射性废物流的电感耦合等离子体质谱仪安装修改

Modification of a Secondary Ion Mass Spectrometer to Allow the Examination of Highly Radioactive Specimens

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