Ion Trapping and Cathode Bombardment by Trapped Ions in DC Photoguns

摘要

DC photoguns are used to produce high-quality, high intensity electron beams for accelerator driven applications. Ion bombardment is believed to be the major cause of degradation of the photocathode efficiency. Additionally to ions produced in the accelerating cathode-anode gap, the electron beam can ionize the residual gas in the transport line. These ions are trapped transversely within the beam and can drift back to the accelerating gap and can tribute to the bombardment rate of the cathode. This paper proposes a method to reduce the flow of ions produced in the beam transport line and drifting back to the cathode anode gap by introducing a positive potential barrier that repels the trapped ions. The reduced ion bombardment rate and increased life time of photocathodes will reduce the downtime required to service photoinjectors and associated costs.