首页> 美国政府科技报告 >Waste-surface mapping of the Fernald K-65 silos using a structured light measurement system
【24h】

Waste-surface mapping of the Fernald K-65 silos using a structured light measurement system

机译:使用结构光测量系统对Fernald K-65筒仓进行废液表面测绘

获取原文

摘要

A remotely operated surface-mapping measurement system was developed by the Robotics & Process Systems Division at Oak Ridge National Laboratory for use in the K-65 waste-storage silos at Fernald, Ohio. The mapping system used three infrared line-generating laser diodes as illumination sources and three high-resolution, low-lux, calibrated, black-and-white, charge-coupled-device video cameras as receivers. These components were combined to form structured light source range and direction sensors with six different possible emitter-receiver pairs. A technology demonstration and predeployment tests were performed at Fernald using the empty Silo 4 into which was placed rectangular objects of known dimensions. These objects were scanned by the structured light sources to demonstrate functionality and verify that the system was giving sufficiently accurate range data in three dimensions. The structured light sources were deployed in Silos 1 and 2 to scan the waste surfaces. The resulting data were merged to create three-dimensional maps of those surfaces. A bentonite clay cap was placed over the waste surfaces and surface maps were obtained. The change in surface height before and after bentonite addition was utilized as a measure of clay cap thickness.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号