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X-Ray Study of Microstructure and Grain Boundary Statistics in Nanocrystalline Materials.

机译：纳米晶材料微观结构和晶界统计的X射线研究。

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作者
Zhilyaev, A. P.; Alexandrov, I. V.; Valiev, R. Z.;
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年度 2000
页码 1-8
总页数 8
原文格式 PDF
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X rays; Grain boundaries; Nanotechnology; Nanostructures; Mechanical properties; Microstructure; Symposia; Physical properties; Statistics; Grain size; Crystals; Oxides; Workshops; Electrodeposition; Component reports; Ufg(Ultra-fine grained); Nc(Nanocrystalline); Nato furnished; Foreign reports; Aq f02-02-0283;

机译：X射线;晶界;纳米技术;纳米结构;机械性能;微观结构;专题讨论会;物理性质;统计学;晶粒尺寸;晶体;氧化物;车间;电沉积;组分报告; Ufg（超细晶粒）; Nc（纳米晶）;北约家具;外国报道; aq f02-02-0283;

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3. Microscopic model for exchange bias from grain-boundary disorder in a ferromagnet/antiferromagnet thin film with a nanocrystalline microstructure [J] . D. L. Cortie, A. G. Biternas, R. W. Chantrell, Applied Physics Letters . 2014,第3期

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4. X-ray study of microstructure grain boundary statistics in nanocrystalline materials [C] . A. P. Zhilyaev, I. V. Alexandrov, R. Z. Valiev NATO Advanced Research Workshop on Nanostructured Films and Coatings . 2000

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X-Ray Study of Microstructure and Grain Boundary Statistics in Nanocrystalline Materials.

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