International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (13th), held at Wheeling, West Virginia, on 13-17 September 2009

摘要

The Thirteenth International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XIII) was a conference on the physics of semiconductors with specials emphasis on defects. It covered application aspects as well as fundamental questions regarding the physics of defects. The conference took place September 13-17, 2009, at the Olgebay Conference Center and Resort, Wheeling, West Virginia.