Integrated Circuit Electromagnetic Susceptibility Investigation - Phase II. Susceptibility Survey Study

摘要

A comprehensive analysis of RF effects in pn junctions has begun on the 7400 quad two-input TTL NAND gate (see 'Bipolar NAND Gate Study', Report MDC E1123) and the 741 operational amplifier (see 'Bipolar Op Amp Study', Report MDC E1124). The basic RF interference phenomenon for these devices is considered to be rectification at the pn junctions. This survey was performed to provide some assurance that the 7400 and 741 were not 'odd balls' with regard to susceptibility levels and effects, to obtain more information on the range of susceptibility levels for various digital and linear devices, and to provide data that can be used to verify analysis techniques derived from the 7400 and 741 studies. RF susceptibility testing was performed on 10 digital and 10 linear devices. The basic results of this survey indicate linear devices to be more susceptible than digital. The range of susceptibility threshold levels was from 0.000003 to 0.27 watts for linear devices and from 0.0029 to 3.8 watts for digital devices. In general, for digital devices, the output in a logical low state was found most susceptible, and for linear devices, an input (usually inverting) was found most susceptible. (Author)