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Storage Reliability of Missile Materiel Program,Monolithic Bipolar SSI/MSI Digital and Linear Integrated Circuit Analysis.

机译：导弹材料存储可靠性，单片双极ssI / msI数字和线性集成电路分析。

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This report documents findings on the non-operating reliability of monolithic bipolar SSI/MSI digital and linear integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail.

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作者
malik,dennis f.;
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年度 1978
页码 1-125
总页数 125
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Integrated circuits; Guided missile components; Reliability(Electronics); Storage; Monolithic structures(Electronics); Bipolar systems; Digital systems; Linear systems; Real time; Accelerated testing; Predictions; Mathematical models; Aging(Materials); Operational readiness; Microelectronics; Data bases;

机译：集成电路;导弹部件;可靠性（电子）;存储;单片结构（电子）;双极系统;数字系统;线性系统;实时;加速测试;预测;数学模型;老化（材料）;运行准备;微电子;数据库;

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专利

1. Solid state: Japan agrees not to undersell U.S. semiconductor makers engineers scramble to make application-specific ICs digital signal processing enters marketplace bipolar and MOS circuits integrated on same chip [J] . Fischetti Mark A. Spectrum, IEEE . 1987,第1期

机译：固态：日本同意不出售美国半导体制造商的工程师争夺让专用IC数字信号处理进入集成在同一芯片上的市场双极和MOS电路
2. Demonstration and Characterization of Bipolar Monolithic Integrated Circuits in 4H-SiC [J] . Lee J.-Y., Singh S., Cooper J. A. IEEE Transactions on Electron Devices . 2008,第8期

机译：4H-SiC中双极单片集成电路的演示和表征
3. SPECTRAL SENSITIVITY OF IR PHOTODETECTORS IN MONOLITHIC BIPOLAR INTEGRATED CIRCUITS [J] . V. I. Blynskii, V. A. Emelyanov, E. S. Golub, Journal of Applied Spectroscopy . 2008,第4期

机译：红外光检测剂在单分子双极集成电路中的光谱敏感性
4. VERIFICATION METHOD OF MISSILE MATERIEL'RELIABILITY PARAMETERS BASED ON THE STOCHASTIC PROCESSES THEORY [C] . SUI XIN-JIN, rnZHOU JING-HUI Proceedings of the seventh international conference on reliability，maintainability and safety (I) . 2007

机译：基于随机过程理论的导弹材料可靠性参数验证方法
5. An integrated circuit reliability model and its applicability towards improving programmable logic device reliability. [D] . Paunicka, James Louis. 1992

机译：集成电路可靠性模型及其在提高可编程逻辑器件可靠性方面的适用性。
6. Intra- and interobserver reliability analysis of digital radiographic measurements for pediatric orthopedic parameters using a novel PACS integrated computer software program [O] . Eitan Segev, Yoram Hemo, Shlomo Wientroub, 2010

机译：使用新型PACS集成计算机软件程序对数字射线照相术测量儿科骨科参数的观察者内和观察者间可靠性分析
7. A digital tuning scheme for digitally programmable integrated continuous-time filters and techniques for high-precision monolithic linear circuit design and implementation [O] . Yu, Chong-Gun 1993

机译：用于数字可编程集成连续时间滤波器的数字调谐方案以及用于高精度单片线性电路设计和实现的技术
8. Storage Reliability of Missile Materiel Program,Monolithic Bipolar SSI/MSI Digital Integrated Circuit Analysis. [R] . malik,dennis f. 1976

机译：导弹材料存储可靠性，单片双极性ssI / msI数字集成电路分析。

Storage Reliability of Missile Materiel Program,Monolithic Bipolar SSI/MSI Digital and Linear Integrated Circuit Analysis.

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