Storage Reliability of Missile Materiel Program,Monolithic Bipolar SSI/MSI Digital Integrated Circuit Analysis.

摘要

This report documents findings on the non-operating reliability of monolithic bipolar SSI/MSI digital integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail. This information is part of a research program being conducted by the U. S. Army Missile Command,Redstone Arsenal,Alabama. The objective of this program is the development of non-operating (storage) reliability prediction and assurance techniques for missile materiel. (Author)