Unified Treatment of the Theory of Six-Port Reflectometer Calibration Using the Minimum of Standards

摘要

This report presents a unified treatment of theory for calibrating the six-port reflectometer and the dual reflectometer network analyzer for measuring power and scattering coefficients, given the minimum of standards for each. It describes a reflectometer in terms of voltage variables and reduces the calibration theory to equations in real unknowns to facilitate encoding the computation necessary for known calibration methods in a low-level computer language. The treatment forms the basis for software in use with six-port reflectometers and dual six-port network analysers in development at RSRE for comparing RF and microwave metrology standards. (Author)