Computer Aided Design Tools and Algorithms for Submicron Technologies

摘要

Advanced algorithms for two and three dimensional modeling of semiconductordevices have been developed, implemented on parallel computers and tested using several high performance technologies. Computational limitations for semiconductor device analysis have been extended to greater than 100000 nodes and speedup factors greater than 10-fold have been realized using distributed memory (MIMD) architectures. Two classes of algorithms have been explored using parallel processing-distributed multifrontal (DMF) and Monte Carl (MC). The DMF algorithm has been implemented and tested for 3D device analysis of MOS, bipolar and